Journals and Conferences that author prefers

Journals

1. International Journal of Parallel Programming (1 paper(s))
2. Integration (1 paper(s))
3. IEEE Trans. Computers (1 paper(s))
4. CoRR (1 paper(s))
5. IEEE Transactions on Reliability (1 paper(s))
6. IEEE Design & Test of Computers (1 paper(s))

Conferences

1. (10 paper(s))
2. Design, Automation, and Test in Europe (5 paper(s))
3. ACM Great Lakes Symposium on VLSI (4 paper(s))
4. International Conference on Formal Methods and Models for Co-Design (4 paper(s))
5. Workshop on Microprocessor Test and Verification (3 paper(s))
6. International Symposium on Quality Electronic Design (2 paper(s))
7. International Conference on Hardware Software Codesign (1 paper(s))
8. Defect and Fault Tolerance in VLSI Systems (1 paper(s))
9. International Test Conference (ITC) (1 paper(s))
10. IEEE VLSI Test Symposium (1 paper(s))
11. School on Formal Methods for the Design of Computer, Communication and Software Systems (1 paper(s))
12. (1 paper(s))