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Journals and Conferences that author prefers

Ronald D. Blanton: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]


  1. IEEE Design & Test of Computers (2 paper(s))
  2. IEEE Trans. on CAD of Integrated Circuits and Systems (2 paper(s))
  3. IEEE Trans. Computers (1 paper(s))
  4. ACM Trans. Design Autom. Electr. Syst. (1 paper(s))
  5. IEEE Trans. VLSI Syst. (1 paper(s))


  1. International Test Conference (ITC) (10 paper(s))
  2. (3 paper(s))
  3. Design Automation Conference (DAC) (2 paper(s))
  4. International Symposium on Fault-Tolerant Computing (FTCS) (1 paper(s))
  5. International Conference on Computer Design (ICCD) (1 paper(s))
  6. Annual Symposium on VLSI (1 paper(s))
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