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Journals and Conferences that author prefers


Régis Leveugle: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Journals

  1. IEEE Trans. Computers (4 paper(s))
  2. Microelectronics Journal (1 paper(s))
  3. J. Electronic Testing (1 paper(s))

Conferences

  1. International On-Line Testing Symposium / Workshop (12 paper(s))
  2. Defect and Fault Tolerance in VLSI Systems (11 paper(s))
  3. (9 paper(s))
  4. Synthesis for Control Dominated Circuits (4 paper(s))
  5. Design, Automation, and Test in Europe (3 paper(s))
  6. Design Automation Conference (DAC) (2 paper(s))
  7. International Test Conference (ITC) (2 paper(s))
  8. (2 paper(s))
  9. Conference on Very Large Scale Integration (VLSI) (2 paper(s))
  10. European Design and Test Conference (EDAC) (2 paper(s))
  11. International Symposium on Fault-Tolerant Computing (FTCS) (2 paper(s))
  12. Microelectronics Systems Education (1 paper(s))
  13. Workshop on Electronic Design, Test and Applications (1 paper(s))
  14. IEEE VLSI Test Symposium (1 paper(s))
  15. Embedded and Ubiquitous Computing (1 paper(s))
  16. (1 paper(s))
  17. International Conference on Computer Design (ICCD) (1 paper(s))
  18. International Parallel (and Distributed) Processing Symposium (IP(D)PS) (1 paper(s))
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