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Journals and Conferences that author prefers

Peter Sandborn: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]


  1. IEEE Design & Test of Computers (2 paper(s))
  2. Microelectronics Reliability (1 paper(s))
  3. J. Electronic Testing (1 paper(s))


  1. International Test Conference (ITC) (2 paper(s))
  2. Design Automation Conference (DAC) (1 paper(s))
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