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Journals and Conferences that author prefers


John A. Waicukauski: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Journals

  1. IBM Journal of Research and Development (1 paper(s))
  2. IEEE Trans. on CAD of Integrated Circuits and Systems (1 paper(s))

Conferences

  1. International Test Conference (ITC) (17 paper(s))
  2. IEEE VLSI Test Symposium (5 paper(s))
  3. Design Automation Conference (DAC) (3 paper(s))
  4. (1 paper(s))
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