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Journals and Conferences that author prefers

Mark Zwolinski: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]


  1. Computer-Aided Design (3 paper(s))
  2. Microelectronics Reliability (3 paper(s))
  3. IEEE Trans. on CAD of Integrated Circuits and Systems (2 paper(s))
  4. IEEE Trans. Pattern Anal. Mach. Intell. (1 paper(s))
  5. IEEE Trans. Computers (1 paper(s))
  6. IEEE Trans. Evolutionary Computation (1 paper(s))
  7. CoRR (1 paper(s))


  1. IEEE International Symposium on Circuits and Systems (ISCAS) (6 paper(s))
  2. (5 paper(s))
  3. Design, Automation, and Test in Europe (3 paper(s))
  4. International On-Line Testing Symposium / Workshop (2 paper(s))
  5. VLSI Design (2 paper(s))
  6. Defect and Fault Tolerance in VLSI Systems (1 paper(s))
  7. Intelligent Data Engineering and Automated Learning (IDEAL) (1 paper(s))
  8. Conference on Very Large Scale Integration (VLSI) (1 paper(s))
  9. (1 paper(s))
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