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Journals and Conferences that author prefers

Isabel C. Teixeira: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Journals

  1. J. Electronic Testing (1 paper(s))

Conferences

  1. (9 paper(s))
  2. International On-Line Testing Symposium / Workshop (6 paper(s))
  3. International Test Conference (ITC) (5 paper(s))
  4. Defect and Fault Tolerance in VLSI Systems (4 paper(s))
  5. Design, Automation, and Test in Europe (2 paper(s))
  6. (2 paper(s))
  7. IFIP WG10.3 Publications (2 paper(s))
  8. IEEE VLSI Test Symposium (2 paper(s))
  9. Field-Programmable Logic and Applications (FPL) (1 paper(s))
  10. International Conference on Enterprise Information Systems (ICEIS) (1 paper(s))
  11. Object-Oriented Real-Time Distributed Computing (1 paper(s))
  12. International Symposium on Quality Electronic Design (1 paper(s))
  13. Annual Symposium on VLSI (1 paper(s))
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