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Journals and Conferences that author prefers

Adelio Salsano: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Journals

  1. IEEE Trans. Computers (2 paper(s))
  2. Appl. Soft Comput. (1 paper(s))
  3. IEEE T. Fuzzy Systems (1 paper(s))
  4. CoRR (1 paper(s))
  5. IEEE Transactions on Reliability (1 paper(s))
  6. IEEE Trans. VLSI Syst. (1 paper(s))
  7. J. Electronic Testing (1 paper(s))

Conferences

  1. Defect and Fault Tolerance in VLSI Systems (13 paper(s))
  2. IEEE International Symposium on Circuits and Systems (ISCAS) (5 paper(s))
  3. (5 paper(s))
  4. International On-Line Testing Symposium / Workshop (4 paper(s))
  5. Design, Automation, and Test in Europe (1 paper(s))
  6. International Conference on Image Processing (1 paper(s))
  7. Annual Symposium on VLSI (1 paper(s))
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NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
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