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Journals and Conferences that author prefers

Paul J. Thadikaran: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Journals

  1. ACM Trans. Design Autom. Electr. Syst. (2 paper(s))
  2. IEEE Trans. Computers (1 paper(s))
  3. IEEE Trans. VLSI Syst. (1 paper(s))

Conferences

  1. International Test Conference (ITC) (3 paper(s))
  2. VLSI Design (2 paper(s))
  3. Design, Automation, and Test in Europe (1 paper(s))
  4. International Symposium on Fault-Tolerant Computing (FTCS) (1 paper(s))
  5. Workshop on Microprocessor Test and Verification (1 paper(s))
  6. IEEE VLSI Test Symposium (1 paper(s))
  7. (1 paper(s))
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NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
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