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Journals and Conferences that author prefers

Kamran Zarrineh: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Journals

  1. IEEE Design & Test of Computers (1 paper(s))
  2. IEEE Trans. VLSI Syst. (1 paper(s))

Conferences

  1. International Test Conference (ITC) (4 paper(s))
  2. International Conference on Computer Design (ICCD) (2 paper(s))
  3. IEEE VLSI Test Symposium (2 paper(s))
  4. Design, Automation, and Test in Europe (1 paper(s))
  5. Defect and Fault Tolerance in VLSI Systems (1 paper(s))
  6. International Symposium on Fault-Tolerant Computing (FTCS) (1 paper(s))
  7. IEEE International Symposium on Circuits and Systems (ISCAS) (1 paper(s))
  8. Memory Technology, Design and Testing (1 paper(s))
  9. (1 paper(s))
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NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
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