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Journals and Conferences that author prefers

Farzin Karimi: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]


  1. IEEE Micro (1 paper(s))
  2. Microelectronics Journal (1 paper(s))


  1. Memory Technology, Design and Testing (3 paper(s))
  2. Defect and Fault Tolerance in VLSI Systems (2 paper(s))
  3. International On-Line Testing Symposium / Workshop (1 paper(s))
  4. International Test Conference (ITC) (1 paper(s))
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