Journals and Conferences that author prefers

Journals

1. IEEE Trans. Computers (4 paper(s))
2. IEEE Trans. on CAD of Integrated Circuits and Systems (3 paper(s))
3. IEEE Trans. VLSI Syst. (3 paper(s))
4. CoRR (2 paper(s))
5. Inf. Sci. (1 paper(s))
6. J. ACM (1 paper(s))
7. ACM Trans. Design Autom. Electr. Syst. (1 paper(s))
8. J. Electronic Testing (1 paper(s))

Conferences

1. Design Automation Conference (DAC) (15 paper(s))
2. (14 paper(s))
3. Design, Automation, and Test in Europe (11 paper(s))
4. International Symposium on Microarchitecture (MICRO) (6 paper(s))
5. IEEE VLSI Test Symposium (6 paper(s))
6. International Conference on Computer Design (ICCD) (6 paper(s))
7. International Test Conference (ITC) (5 paper(s))
8. International Conference on Computer Aided Design (ICCAD) (4 paper(s))
9. Asian Test Symposium (2 paper(s))
10. (2 paper(s))
11. International On-Line Testing Symposium / Workshop (2 paper(s))
12. ACM Annual Computer Science Conference (CSC) (1 paper(s))
13. International Conference on Hardware Software Codesign (1 paper(s))
14. Field-Programmable Logic and Applications (FPL) (1 paper(s))
15. Field-Programmable Custom Computing Machines (FCCM) (1 paper(s))
16. Symposium on Field Programmable Gate Arrays (FPGA) (1 paper(s))
17. International Conference on Supercomputing (ICS) (1 paper(s))
18. IEEE International Symposium on Biomedical Imaging (1 paper(s))
19. International Symposium on Low Power Electronics and Design (1 paper(s))