Journals and Conferences that author prefers

Journals

1. IEEE Trans. on CAD of Integrated Circuits and Systems (2 paper(s))
2. ACM Trans. Design Autom. Electr. Syst. (2 paper(s))
3. J. UCS (1 paper(s))
4. IEEE Trans. Computers (1 paper(s))
5. Microelectronics Journal (1 paper(s))

Conferences

1. Defect and Fault Tolerance in VLSI Systems (11 paper(s))
2. International On-Line Testing Symposium / Workshop (8 paper(s))
3. High-Performance Computing and Networking (HPCN Europe) (6 paper(s))
4. IEEE VLSI Test Symposium (6 paper(s))
5. Asian Test Symposium (5 paper(s))
6. International Test Conference (ITC) (5 paper(s))
7. Design, Automation, and Test in Europe (5 paper(s))
8. (4 paper(s))
9. International Conference on Tools with Artificial Intelligence (ICTAI) (3 paper(s))
10. Workshop on Microprocessor Test and Verification (2 paper(s))
11. EvoWorkshops (2 paper(s))
12. Field-Programmable Logic and Applications (FPL) (2 paper(s))
13. SAFECOMP (2 paper(s))
14. ACM Great Lakes Symposium on VLSI (2 paper(s))
15. Advanced Information Networking and Applications (1 paper(s))
16. International Conference on Evolutionary Computation (1 paper(s))
17. Correct Hardware Design and Verification Methods (CHARME) (1 paper(s))
18. International Conference on Hardware Software Codesign (1 paper(s))
19. Memory Technology, Design and Testing (1 paper(s))
20. Dependable Systems and Networks (1 paper(s))
21. Parallel, Distributed and Network-Based Processing (1 paper(s))
22. European Dependable Computing Conference (EDCC) (1 paper(s))
23. Parallel Problem Solving from Nature (PPSN) (1 paper(s))
24. ACM Symposium on Applied Computing (SAC) (1 paper(s))
25. Source Code Analysis and Manipulation (1 paper(s))
26. International Conference on Computer Design (ICCD) (1 paper(s))