Journals and Conferences that author prefers

Journals

1. IEEE Design & Test of Computers (4 paper(s))
2. IEEE Trans. on CAD of Integrated Circuits and Systems (4 paper(s))
3. IEEE Trans. Computers (3 paper(s))
4. IEEE Trans. VLSI Syst. (2 paper(s))
5. Integration (1 paper(s))
6. J. Electronic Testing (1 paper(s))

Conferences

1. Design, Automation, and Test in Europe (11 paper(s))
2. IEEE VLSI Test Symposium (10 paper(s))
3. International Test Conference (ITC) (10 paper(s))
4. (8 paper(s))
5. International On-Line Testing Symposium / Workshop (8 paper(s))
6. International Conference on Computer Design (ICCD) (4 paper(s))
7. Defect and Fault Tolerance in VLSI Systems (3 paper(s))
8. International Symposium on Fault-Tolerant Computing (FTCS) (3 paper(s))
9. Asian Test Symposium (2 paper(s))
10. International Conference on Computer Aided Design (ICCAD) (2 paper(s))
11. IEEE Symposium on Computer Arithmetic (1 paper(s))
12. Pacific Rim International Symposium on Dependable Computing (1 paper(s))
13. Dependable Systems and Networks (1 paper(s))
14. International Work-Conference on Artificial and Natural Neural Networks (IWANN) (1 paper(s))
15. European Design and Test Conference (EDAC) (1 paper(s))
16. (1 paper(s))
17. Field-Programmable Logic and Applications (FPL) (1 paper(s))
18. ACM Great Lakes Symposium on VLSI (1 paper(s))
19. Memory Technology, Design and Testing (1 paper(s))