Journals and Conferences that author prefers

Journals

1. IEEE Trans. VLSI Syst. (7 paper(s))
2. IEEE Trans. on CAD of Integrated Circuits and Systems (2 paper(s))
3. CoRR (2 paper(s))
4. J. Electronic Testing (2 paper(s))
5. IEEE Trans. Computers (1 paper(s))
6. ACM Trans. Embedded Comput. Syst. (1 paper(s))
7. ACM Trans. Design Autom. Electr. Syst. (1 paper(s))

Conferences

1. (28 paper(s))
2. Design, Automation, and Test in Europe (9 paper(s))
3. International On-Line Testing Symposium / Workshop (5 paper(s))
4. International Symposium on Quality Electronic Design (4 paper(s))
5. IEEE VLSI Test Symposium (3 paper(s))
6. Asian Test Symposium (3 paper(s))
7. VLSI Design (3 paper(s))
8. Asia and South Pacific Design Automation Conference (ASP-DAC) (2 paper(s))
9. Design Automation Conference (DAC) (2 paper(s))
10. Defect and Fault Tolerance in VLSI Systems (2 paper(s))
11. International Conference on Computer Design (ICCD) (2 paper(s))
12. International Symposium on High-Performance Computer Architecture (HPCA) (1 paper(s))
13. International Conference on Computer Aided Design (ICCAD) (1 paper(s))
14. International Conference on Image Processing (1 paper(s))
15. International Symposium on Low Power Electronics and Design (1 paper(s))