Journals and Conferences that author prefers

Journals

1. IEEE Trans. Computers (5 paper(s))
2. IEEE Trans. VLSI Syst. (3 paper(s))
3. IEEE Computer (2 paper(s))
4. J. Electronic Testing (2 paper(s))
5. IEEE Design & Test of Computers (1 paper(s))
6. IEEE Trans. on CAD of Integrated Circuits and Systems (1 paper(s))
7. ACM Trans. Design Autom. Electr. Syst. (1 paper(s))
8. IEEE Transactions on Reliability (1 paper(s))
9. J. Low Power Electronics (1 paper(s))

Conferences

1. International Test Conference (ITC) (11 paper(s))
2. IEEE VLSI Test Symposium (8 paper(s))
3. (7 paper(s))
4. VLSI Design (6 paper(s))
5. Asian Test Symposium (4 paper(s))
6. Defect and Fault Tolerance in VLSI Systems (3 paper(s))
7. International Conference on Parallel Processing (ICPP) (3 paper(s))
8. International Symposium on Fault-Tolerant Computing (FTCS) (2 paper(s))
9. International Symposium on Quality Electronic Design (2 paper(s))
10. Asia and South Pacific Design Automation Conference (ASP-DAC) (1 paper(s))
11. (1 paper(s))
12. International Conference on Computer Design (ICCD) (1 paper(s))
13. International Conference on Distributed Computing Systems (ICDCS) (1 paper(s))
14. International On-Line Testing Symposium / Workshop (1 paper(s))
15. (1 paper(s))