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Journals and Conferences that author prefers

Huawei Li: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]


  1. J. Comput. Sci. Technol. (2 paper(s))
  2. IEEE Trans. VLSI Syst. (1 paper(s))
  3. J. Electronic Testing (1 paper(s))


  1. (16 paper(s))
  2. Asian Test Symposium (8 paper(s))
  3. Asia and South Pacific Design Automation Conference (ASP-DAC) (2 paper(s))
  4. Defect and Fault Tolerance in VLSI Systems (2 paper(s))
  5. (2 paper(s))
  6. International Symposium on Quality Electronic Design (1 paper(s))
  7. Pacific Rim International Symposium on Dependable Computing (1 paper(s))
  8. IEEE VLSI Test Symposium (1 paper(s))
  9. Human-Computer Interaction (1 paper(s))
  10. (1 paper(s))
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