Journals and Conferences that author prefers

Journals

1. IEEE Trans. on CAD of Integrated Circuits and Systems (11 paper(s))
2. IEEE Design & Test of Computers (4 paper(s))
3. IEEE Trans. Computers (3 paper(s))
4. ACM Trans. Design Autom. Electr. Syst. (2 paper(s))
5. IEEE Transactions on Reliability (2 paper(s))
6. IEEE Trans. VLSI Syst. (2 paper(s))
7. Journal of Systems and Software (1 paper(s))
8. MONET (1 paper(s))
9. Microprocessors and Microsystems (1 paper(s))
10. Microelectronics Journal (1 paper(s))
11. J. Electronic Testing (1 paper(s))

Conferences

1. Design Automation Conference (DAC) (12 paper(s))
2. International Test Conference (ITC) (9 paper(s))
3. International Conference on Computer Aided Design (ICCAD) (5 paper(s))
4. Asia and South Pacific Design Automation Conference (ASP-DAC) (3 paper(s))
5. Design, Automation, and Test in Europe (3 paper(s))
6. International Conference on Computer Design (ICCD) (3 paper(s))
7. Cryptographic Hardware and Embedded Systems (CHES) (2 paper(s))
8. Defect and Fault Tolerance in VLSI Systems (2 paper(s))
9. Symposium on Field Programmable Gate Arrays (FPGA) (2 paper(s))
10. International Symposium on Fault-Tolerant Computing (FTCS) (2 paper(s))
11. International Symposium on Microarchitecture (MICRO) (1 paper(s))
12. International Conference on Hardware Software Codesign (1 paper(s))
13. Workshop on Power and Timing Modeling, Optimization and Simulation (PATMOS) (1 paper(s))
14. IEEE VLSI Test Symposium (1 paper(s))
15. Dependable Systems and Networks (1 paper(s))
16. (1 paper(s))
17. (1 paper(s))
18. International On-Line Testing Symposium / Workshop (1 paper(s))
19. IEEE International Symposium on Circuits and Systems (ISCAS) (1 paper(s))
20. International Symposium on Low Power Electronics and Design (1 paper(s))