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Journals and Conferences that author prefers

Jin-Fu Li: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Journals

  1. IEEE Trans. VLSI Syst. (3 paper(s))
  2. IEEE Micro (1 paper(s))
  3. CoRR (1 paper(s))
  4. IEEE Transactions on Reliability (1 paper(s))
  5. IEEE Design & Test of Computers (1 paper(s))

Conferences

  1. (5 paper(s))
  2. Design, Automation, and Test in Europe (4 paper(s))
  3. Asian Test Symposium (3 paper(s))
  4. IEEE VLSI Test Symposium (3 paper(s))
  5. Defect and Fault Tolerance in VLSI Systems (2 paper(s))
  6. International Test Conference (ITC) (2 paper(s))
  7. Memory Technology, Design and Testing (2 paper(s))
  8. Asia and South Pacific Design Automation Conference (ASP-DAC) (1 paper(s))
  9. International On-Line Testing Symposium / Workshop (1 paper(s))
  10. IEEE International Symposium on Circuits and Systems (ISCAS) (1 paper(s))
  11. (1 paper(s))
NOTICE1
System may not be available sometimes or not working properly, since it is still in development with continuous upgrades
NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
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