Journals and Conferences that author prefers

Journals

1. IEEE Trans. VLSI Syst. (3 paper(s))
2. IEEE Design & Test of Computers (2 paper(s))
3. CoRR (2 paper(s))
4. IEEE Trans. on CAD of Integrated Circuits and Systems (1 paper(s))
5. IEEE Trans. Dependable Sec. Comput. (1 paper(s))
6. ACM Trans. Design Autom. Electr. Syst. (1 paper(s))
7. TACO (1 paper(s))
8. J. Electronic Testing (1 paper(s))

Conferences

1. (13 paper(s))
2. IEEE VLSI Test Symposium (6 paper(s))
3. Design, Automation, and Test in Europe (5 paper(s))
4. International Conference on Computer Aided Design (ICCAD) (4 paper(s))
5. International Conference on Computer Design (ICCD) (4 paper(s))
6. International Test Conference (ITC) (3 paper(s))
7. Asia and South Pacific Design Automation Conference (ASP-DAC) (1 paper(s))
8. Defect and Fault Tolerance in VLSI Systems (1 paper(s))
9. Dependable Systems and Networks (1 paper(s))
10. IEEE International Symposium on Circuits and Systems (ISCAS) (1 paper(s))
11. International Symposium on Quality Electronic Design (1 paper(s))
12. International Symposium on Microarchitecture (MICRO) (1 paper(s))
13. ACM SIGMETRICS Conference on Measurement and Modeling of Computer Systems (1 paper(s))