Journals and Conferences that author prefers

Journals

1. CoRR (2 paper(s))
2. J. Electronic Testing (2 paper(s))
3. RITA (1 paper(s))
4. Microelectronics Journal (1 paper(s))

Conferences

1. (17 paper(s))
2. (5 paper(s))
3. Design, Automation, and Test in Europe (5 paper(s))
4. IEEE International Symposium on Circuits and Systems (ISCAS) (5 paper(s))
5. IEEE VLSI Test Symposium (3 paper(s))
6. IEEE International Workshop on Rapid System Prototyping (3 paper(s))
7. Conference on Very Large Scale Integration (VLSI) (2 paper(s))
8. Engineering of Computer-Based Systems (ECBS) (2 paper(s))
9. International On-Line Testing Symposium / Workshop (2 paper(s))
10. Annual Symposium on VLSI (2 paper(s))
11. Asia and South Pacific Design Automation Conference (ASP-DAC) (1 paper(s))
12. (1 paper(s))
13. Design Automation Conference (DAC) (1 paper(s))
14. Field-Programmable Logic and Applications (FPL) (1 paper(s))
15. (1 paper(s))
16. (1 paper(s))
17. (1 paper(s))
18. International Conference on Computer Design (ICCD) (1 paper(s))
19. International Conference on Image Analysis and Recognition (1 paper(s))
20. International Parallel (and Distributed) Processing Symposium (IP(D)PS) (1 paper(s))