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Journals and Conferences that author prefers


Yiorgos Makris: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Journals

  1. IEEE Trans. on CAD of Integrated Circuits and Systems (3 paper(s))
  2. IEEE Trans. Computers (1 paper(s))
  3. Microelectronics Journal (1 paper(s))
  4. Integration (1 paper(s))
  5. IEEE Transactions on Reliability (1 paper(s))
  6. IEEE Design & Test of Computers (1 paper(s))

Conferences

  1. IEEE VLSI Test Symposium (8 paper(s))
  2. (7 paper(s))
  3. Design, Automation, and Test in Europe (5 paper(s))
  4. Defect and Fault Tolerance in VLSI Systems (4 paper(s))
  5. Asian Test Symposium (3 paper(s))
  6. International Conference on Computer Design (ICCD) (3 paper(s))
  7. International Test Conference (ITC) (3 paper(s))
  8. Symposium on Asynchronous Circuits and Systems (2 paper(s))
  9. ACM Great Lakes Symposium on VLSI (2 paper(s))
  10. International Conference on Computer Aided Design (ICCAD) (2 paper(s))
  11. International On-Line Testing Symposium / Workshop (2 paper(s))
  12. International Symposium on Quality Electronic Design (2 paper(s))
  13. Asia and South Pacific Design Automation Conference (ASP-DAC) (1 paper(s))
  14. VLSI Design (1 paper(s))
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