Journals and Conferences that author prefers

Journals

1. IEEE Design & Test of Computers (9 paper(s))
2. IEEE Trans. on CAD of Integrated Circuits and Systems (5 paper(s))
3. IEEE Trans. Computers (4 paper(s))
4. IEEE Computer (1 paper(s))
5. IEEE Micro (1 paper(s))
6. IEEE Trans. VLSI Syst. (1 paper(s))
7. Commun. ACM (1 paper(s))

Conferences

1. (26 paper(s))
2. IEEE VLSI Test Symposium (15 paper(s))
3. International Test Conference (ITC) (11 paper(s))
4. International On-Line Testing Symposium / Workshop (4 paper(s))
5. Design Automation Conference (DAC) (3 paper(s))
6. Defect and Fault Tolerance in VLSI Systems (2 paper(s))
7. Symposium on Asynchronous Circuits and Systems (1 paper(s))
8. Design, Automation, and Test in Europe (1 paper(s))
9. Conference on Very Large Scale Integration (VLSI) (1 paper(s))
10. Dependable Systems and Networks (1 paper(s))
11. Evolvable Hardware (1 paper(s))
12. Field-Programmable Custom Computing Machines (FCCM) (1 paper(s))
13. International Conference on Computer Aided Design (ICCAD) (1 paper(s))
14. International Conference on Computer Design (ICCD) (1 paper(s))
15. International Symposium on Quality Electronic Design (1 paper(s))
16. Symposium on Reliable Distributed Systems (SRDS) (1 paper(s))
17. VLSI Design (1 paper(s))