Journals and Conferences that author prefers

Journals

1. IEEE Design & Test of Computers (6 paper(s))
2. IEEE Trans. Computers (5 paper(s))
3. it - Information Technology (1 paper(s))
4. IEEE Trans. on CAD of Integrated Circuits and Systems (1 paper(s))
5. Microelectronics Journal (1 paper(s))
6. IEEE Trans. VLSI Syst. (1 paper(s))
7. CoRR (1 paper(s))

Conferences

1. International Test Conference (ITC) (8 paper(s))
2. IEEE VLSI Test Symposium (4 paper(s))
3. (3 paper(s))
4. Asian Test Symposium (2 paper(s))
5. Design Automation Conference (DAC) (2 paper(s))
6. International Conference on Computer Aided Design (ICCAD) (2 paper(s))
7. Microelectronics Systems Education (2 paper(s))
8. VLSI Design (2 paper(s))
9. Design, Automation, and Test in Europe (1 paper(s))
10. Workshop on Electronic Design, Test and Applications (1 paper(s))
11. ACM Great Lakes Symposium on VLSI (1 paper(s))
12. International Conference on Computer Design (ICCD) (1 paper(s))
13. Fault-Tolerant Computing Systems / Fehlertolerierende Rechensysteme (1 paper(s))
14. International Symposium on Low Power Electronics and Design (1 paper(s))