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Journals and Conferences that author prefers

Zaid Al-Ars: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Journals

  1. IEEE Trans. Computers (2 paper(s))
  2. IEEE Trans. on CAD of Integrated Circuits and Systems (2 paper(s))

Conferences

  1. Asian Test Symposium (7 paper(s))
  2. Design, Automation, and Test in Europe (6 paper(s))
  3. Memory Technology, Design and Testing (5 paper(s))
  4. IEEE VLSI Test Symposium (5 paper(s))
  5. (4 paper(s))
  6. (1 paper(s))
  7. International Test Conference (ITC) (1 paper(s))
  8. (1 paper(s))
NOTICE1
System may not be available sometimes or not working properly, since it is still in development with continuous upgrades
NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
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