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Journals and Conferences that author prefers

Sobeeh Almukhaizim: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]


  1. IEEE Trans. Computers (1 paper(s))
  2. IEEE Trans. on CAD of Integrated Circuits and Systems (1 paper(s))
  3. Microelectronics Journal (1 paper(s))


  1. Design, Automation, and Test in Europe (3 paper(s))
  2. (3 paper(s))
  3. International Conference on Computer Design (ICCD) (2 paper(s))
  4. Asian Test Symposium (1 paper(s))
  5. Defect and Fault Tolerance in VLSI Systems (1 paper(s))
  6. International On-Line Testing Symposium / Workshop (1 paper(s))
  7. International Symposium on Quality Electronic Design (1 paper(s))
  8. IEEE VLSI Test Symposium (1 paper(s))
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