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Journals and Conferences that author prefers


Sobeeh Almukhaizim: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Journals

  1. IEEE Trans. Computers (1 paper(s))
  2. IEEE Trans. on CAD of Integrated Circuits and Systems (1 paper(s))
  3. Microelectronics Journal (1 paper(s))

Conferences

  1. Design, Automation, and Test in Europe (3 paper(s))
  2. (3 paper(s))
  3. International Conference on Computer Design (ICCD) (2 paper(s))
  4. Asian Test Symposium (1 paper(s))
  5. Defect and Fault Tolerance in VLSI Systems (1 paper(s))
  6. International On-Line Testing Symposium / Workshop (1 paper(s))
  7. International Symposium on Quality Electronic Design (1 paper(s))
  8. IEEE VLSI Test Symposium (1 paper(s))
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NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
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