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Journals and Conferences that author prefers


Sasikumar Cherubal: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Journals

  1. IEEE Trans. on CAD of Integrated Circuits and Systems (1 paper(s))

Conferences

  1. Design, Automation, and Test in Europe (4 paper(s))
  2. International Test Conference (ITC) (4 paper(s))
  3. Asian Test Symposium (2 paper(s))
  4. VLSI Design (2 paper(s))
  5. Workshop on Electronic Design, Test and Applications (1 paper(s))
  6. Defect and Fault Tolerance in VLSI Systems (1 paper(s))
  7. IEEE VLSI Test Symposium (1 paper(s))
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