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Journals and Conferences that author prefers


Florence Azaïs: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Journals

  1. IEEE Design & Test of Computers (4 paper(s))
  2. J. Electronic Testing (4 paper(s))
  3. Microelectronics Reliability (2 paper(s))
  4. Microelectronics Journal (2 paper(s))
  5. J. Comput. Sci. Technol. (1 paper(s))
  6. IEEE Trans. on CAD of Integrated Circuits and Systems (1 paper(s))

Conferences

  1. IEEE VLSI Test Symposium (7 paper(s))
  2. Asian Test Symposium (6 paper(s))
  3. (6 paper(s))
  4. International Test Conference (ITC) (4 paper(s))
  5. Design, Automation, and Test in Europe (3 paper(s))
  6. (2 paper(s))
  7. Workshop on Electronic Design, Test and Applications (1 paper(s))
  8. Defect and Fault Tolerance in VLSI Systems (1 paper(s))
  9. IFIP WG10.5 (1 paper(s))
  10. Microelectronics Systems Education (1 paper(s))
NOTICE1
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NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
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