Journals and Conferences that author prefers

Journals

1. IEEE Design & Test of Computers (2 paper(s))
2. Graphical Models (1 paper(s))
3. Computer Vision and Image Understanding (1 paper(s))
4. J. Comput. Sci. Technol. (1 paper(s))
5. Journal of Visualization and Computer Animation (1 paper(s))
6. IEEE Trans. on CAD of Integrated Circuits and Systems (1 paper(s))
7. Theor. Comput. Sci. (1 paper(s))
8. Technique et Science Informatiques (1 paper(s))
9. The Visual Computer (1 paper(s))
10. Microelectronics Journal (1 paper(s))
11. J. Electronic Testing (1 paper(s))
12. Computer-Aided Design (1 paper(s))

Conferences

1. Asian Test Symposium (7 paper(s))
2. (7 paper(s))
3. IEEE VLSI Test Symposium (7 paper(s))
4. Design, Automation, and Test in Europe (5 paper(s))
5. International Test Conference (ITC) (5 paper(s))
6. Workshop on Electronic Design, Test and Applications (2 paper(s))
7. Discrete Geometry for Computer Imagery (DGCI) (2 paper(s))
8. European Dependable Computing Conference (EDCC) (2 paper(s))
9. IFIP WG10.5 (2 paper(s))
10. Microelectronics Systems Education (2 paper(s))
11. International Conference in Central Europe on Computer Graphics and Visualization (WSCG) (1 paper(s))
12. (1 paper(s))
13. Defect and Fault Tolerance in VLSI Systems (1 paper(s))
14. TAPSOFT (1 paper(s))
15. VLSI Design (1 paper(s))
16. Workshop on Algebraic Development Techniques (WADT) (1 paper(s))