Journals and Conferences that author prefers

Journals

1. IEEE Trans. VLSI Syst. (6 paper(s))
2. IEEE Design & Test of Computers (4 paper(s))
3. IEEE Trans. on CAD of Integrated Circuits and Systems (4 paper(s))
4. ACM Trans. Design Autom. Electr. Syst. (2 paper(s))
5. Journal of Systems Architecture (1 paper(s))
6. J. Low Power Electronics (1 paper(s))

Conferences

1. IEEE VLSI Test Symposium (25 paper(s))
2. International Test Conference (ITC) (14 paper(s))
3. Defect and Fault Tolerance in VLSI Systems (11 paper(s))
4. (6 paper(s))
5. Asian Test Symposium (4 paper(s))
6. International Conference on Computer Design (ICCD) (3 paper(s))
7. IEEE International Symposium on Circuits and Systems (ISCAS) (3 paper(s))
8. International Conference on Computer Aided Design (ICCAD) (2 paper(s))
9. International On-Line Testing Symposium / Workshop (2 paper(s))
10. Annual Symposium on VLSI (2 paper(s))
11. Design, Automation, and Test in Europe (1 paper(s))
12. Workshop on Electronic Design, Test and Applications (1 paper(s))
13. ACM Great Lakes Symposium on VLSI (1 paper(s))
14. VLSI Design (1 paper(s))