Journals and Conferences that author prefers

Journals

1. IEEE Trans. on CAD of Integrated Circuits and Systems (7 paper(s))
2. IEEE Trans. Computers (6 paper(s))
3. ACM Trans. Design Autom. Electr. Syst. (3 paper(s))
4. IEEE Trans. VLSI Syst. (2 paper(s))
5. IEEE Design & Test of Computers (1 paper(s))

Conferences

1. IEEE VLSI Test Symposium (11 paper(s))
2. International Test Conference (ITC) (10 paper(s))
3. (7 paper(s))
4. VLSI Design (6 paper(s))
5. Design Automation Conference (DAC) (5 paper(s))
6. Asian Test Symposium (4 paper(s))
7. International Conference on Parallel Processing (ICPP) (2 paper(s))
8. Design, Automation, and Test in Europe (1 paper(s))
9. Defect and Fault Tolerance in VLSI Systems (1 paper(s))
10. International Symposium on Fault-Tolerant Computing (FTCS) (1 paper(s))
11. International Conference on Computer Aided Design (ICCAD) (1 paper(s))
12. International Conference on Computer Design (ICCD) (1 paper(s))
13. International Symposium on Quality Electronic Design (1 paper(s))