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Journals and Conferences that author prefers


Marcelo Lubaszewski: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Journals

  1. J. Electronic Testing (2 paper(s))
  2. J. Braz. Comp. Soc. (1 paper(s))
  3. RITA (1 paper(s))
  4. IEEE Trans. Computers (1 paper(s))
  5. IEEE Trans. on CAD of Integrated Circuits and Systems (1 paper(s))
  6. ACM Trans. Design Autom. Electr. Syst. (1 paper(s))
  7. Microelectronics Journal (1 paper(s))
  8. CoRR (1 paper(s))
  9. IEEE Trans. VLSI Syst. (1 paper(s))

Conferences

  1. IEEE VLSI Test Symposium (9 paper(s))
  2. (8 paper(s))
  3. Asian Test Symposium (5 paper(s))
  4. Design, Automation, and Test in Europe (5 paper(s))
  5. (5 paper(s))
  6. International Test Conference (ITC) (4 paper(s))
  7. International Conference on Computer Aided Design (ICCAD) (3 paper(s))
  8. (1 paper(s))
  9. IFIP World Computer Congress (1 paper(s))
  10. IFIP WG10.5 (1 paper(s))
  11. Annual Symposium on VLSI (1 paper(s))
  12. International Workshop System-on-Chip for Real-Time Applications (1 paper(s))
  13. Microelectronics Systems Education (1 paper(s))
  14. VLSI Design (1 paper(s))
  15. Conference on Very Large Scale Integration (VLSI) (1 paper(s))
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