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Journals and Conferences that author prefers

Erik Larsson: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Journals

  1. J. Electronic Testing (2 paper(s))
  2. IEEE Trans. Computers (1 paper(s))
  3. IEEE Trans. on CAD of Integrated Circuits and Systems (1 paper(s))
  4. IEEE Trans. VLSI Syst. (1 paper(s))
  5. BMC Bioinformatics (1 paper(s))

Conferences

  1. (13 paper(s))
  2. Asian Test Symposium (6 paper(s))
  3. Design, Automation, and Test in Europe (3 paper(s))
  4. International Test Conference (ITC) (2 paper(s))
  5. IEEE VLSI Test Symposium (2 paper(s))
  6. (1 paper(s))
  7. Defect and Fault Tolerance in VLSI Systems (1 paper(s))
  8. Euromicro Symposium on Digital Systems Design (1 paper(s))
  9. International Conference on Computer Aided Design (ICCAD) (1 paper(s))
  10. SIGUCCS Conference on User Services (1 paper(s))
  11. Conference on Very Large Scale Integration (VLSI) (1 paper(s))
  12. (1 paper(s))
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NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
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