Journals and Conferences that author prefers

Journals

1. IEEE Trans. on CAD of Integrated Circuits and Systems (4 paper(s))
2. IEEE Design & Test of Computers (3 paper(s))
3. IEEE Trans. Computers (3 paper(s))
4. ACM Trans. Design Autom. Electr. Syst. (2 paper(s))
5. IEEE Trans. VLSI Syst. (2 paper(s))
6. International Journal of Parallel Programming (1 paper(s))
7. J. UCS (1 paper(s))
8. J. Electronic Testing (1 paper(s))

Conferences

1. (20 paper(s))
2. IEEE VLSI Test Symposium (12 paper(s))
3. Design, Automation, and Test in Europe (11 paper(s))
4. VLSI Design (10 paper(s))
5. International Test Conference (ITC) (10 paper(s))
6. Asian Test Symposium (5 paper(s))
7. Design Automation Conference (DAC) (4 paper(s))
8. International Conference on Computer Aided Design (ICCAD) (4 paper(s))
9. International Conference on Computer Design (ICCD) (4 paper(s))
10. International Symposium on Low Power Electronics and Design (4 paper(s))
11. ACM Great Lakes Symposium on VLSI (3 paper(s))
12. Power-Aware Computer Systems (PACS) (2 paper(s))
13. IEEE International Conference on Pervasive Computing and Communications (2 paper(s))
14. Defect and Fault Tolerance in VLSI Systems (2 paper(s))
15. Languages and Compilers for Parallel Computing (LCPC) (1 paper(s))
16. Correct Hardware Design and Verification Methods (CHARME) (1 paper(s))
17. International Symposium on Fault-Tolerant Computing (FTCS) (1 paper(s))
18. International Workshop on Logic & Synthesis (1 paper(s))
19. IEEE Conference on Local Computer Networks (LCN) (1 paper(s))