Journals and Conferences that author prefers

Journals

1. IEEE Trans. VLSI Syst. (4 paper(s))
2. ACM Trans. Embedded Comput. Syst. (3 paper(s))
3. J. Comput. Sci. Technol. (2 paper(s))
4. Journal of Systems Architecture (2 paper(s))
5. IEEE Trans. on CAD of Integrated Circuits and Systems (2 paper(s))
6. J. Electronic Testing (2 paper(s))
7. Integration (1 paper(s))
8. Real-Time Systems (1 paper(s))
9. IEEE Trans. Computers (1 paper(s))
10. ACM Trans. Design Autom. Electr. Syst. (1 paper(s))
11. International Journal of Parallel Programming (1 paper(s))

Conferences

1. (25 paper(s))
2. Design, Automation, and Test in Europe (17 paper(s))
3. Euromicro Symposium on Digital Systems Design (10 paper(s))
4. International Conference on Hardware Software Codesign (7 paper(s))
5. Asian Test Symposium (6 paper(s))
6. EUROMICRO (6 paper(s))
7. Design Automation Conference (DAC) (4 paper(s))
8. Defect and Fault Tolerance in VLSI Systems (4 paper(s))
9. Real-Time Computing Systems and Applications (4 paper(s))
10. International Symposium on Systems Synthesis (3 paper(s))
11. Workshop on Electronic Design, Test and Applications (3 paper(s))
12. Euromicro Conference on Real-Time Systems (ECRTS) (3 paper(s))
13. International Conference on Computer Aided Design (ICCAD) (3 paper(s))
14. International Test Conference (ITC) (2 paper(s))
15. IFIP World Computer Congress (1 paper(s))
16. IEEE International Symposium on Circuits and Systems (ISCAS) (1 paper(s))
17. Object-Oriented Real-Time Distributed Computing (1 paper(s))
18. International Symposium on Quality Electronic Design (1 paper(s))
19. (1 paper(s))
20. Languages, Compilers, and Tools for Embedded Systems (LCTES) (1 paper(s))
21. IEEE Real Time Technology and Applications Symposium (1 paper(s))
22. IEEE VLSI Test Symposium (1 paper(s))
23. International Conference on Engineering of Complex Computer Systems (1 paper(s))
24. International Conference on Parallel Processing (ICPP) (1 paper(s))