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Journals and Conferences that author prefers


Chin-Long Wey: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Journals

  1. IEEE Trans. on CAD of Integrated Circuits and Systems (5 paper(s))
  2. IEEE Trans. Computers (2 paper(s))
  3. Comput. J. (1 paper(s))
  4. CoRR (1 paper(s))
  5. IEEE Trans. VLSI Syst. (1 paper(s))

Conferences

  1. International Conference on Computer Design (ICCD) (7 paper(s))
  2. Asian Test Symposium (4 paper(s))
  3. (4 paper(s))
  4. Design Automation Conference (DAC) (3 paper(s))
  5. IEEE International Symposium on Circuits and Systems (ISCAS) (3 paper(s))
  6. International Test Conference (ITC) (3 paper(s))
  7. ACM Great Lakes Symposium on VLSI (2 paper(s))
  8. Design, Automation, and Test in Europe (1 paper(s))
  9. Defect and Fault Tolerance in VLSI Systems (1 paper(s))
  10. Symposium on Field Programmable Gate Arrays (FPGA) (1 paper(s))
  11. Annual Symposium on VLSI (1 paper(s))
  12. IEEE Real-Time Systems Symposium (RTSS) (1 paper(s))
  13. IEEE VLSI Test Symposium (1 paper(s))
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NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
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