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Journals and Conferences that author prefers

Jean Michel Portal: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]

Journals

  1. IEEE Design & Test of Computers (1 paper(s))
  2. CoRR (1 paper(s))
  3. J. Electronic Testing (1 paper(s))

Conferences

  1. Design, Automation, and Test in Europe (5 paper(s))
  2. International Test Conference (ITC) (5 paper(s))
  3. Asian Test Symposium (4 paper(s))
  4. IEEE International Symposium on Circuits and Systems (ISCAS) (4 paper(s))
  5. (4 paper(s))
  6. Defect and Fault Tolerance in VLSI Systems (1 paper(s))
  7. Field-Programmable Logic and Applications (FPL) (1 paper(s))
  8. Memory Technology, Design and Testing (1 paper(s))
NOTICE1
System may not be available sometimes or not working properly, since it is still in development with continuous upgrades
NOTICE2
The rankings that are presented on this page should NOT be considered as formal since the citation info is incomplete in DBLP
 
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