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Journals and Conferences that author prefers

Jean Michel Portal: [Publications] [Author Rank by year] [Co-authors] [Prefers] [Cites] [Cited by]


  1. IEEE Design & Test of Computers (1 paper(s))
  2. CoRR (1 paper(s))
  3. J. Electronic Testing (1 paper(s))


  1. Design, Automation, and Test in Europe (5 paper(s))
  2. International Test Conference (ITC) (5 paper(s))
  3. Asian Test Symposium (4 paper(s))
  4. IEEE International Symposium on Circuits and Systems (ISCAS) (4 paper(s))
  5. (4 paper(s))
  6. Defect and Fault Tolerance in VLSI Systems (1 paper(s))
  7. Field-Programmable Logic and Applications (FPL) (1 paper(s))
  8. Memory Technology, Design and Testing (1 paper(s))
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