Journals and Conferences that author prefers

Journals

1. IEEE Design & Test of Computers (3 paper(s))
2. IEEE Trans. on CAD of Integrated Circuits and Systems (2 paper(s))
3. Integration (1 paper(s))
4. Journal of Systems and Software (1 paper(s))
5. J. Electronic Testing (1 paper(s))

Conferences

1. IEEE VLSI Test Symposium (11 paper(s))
2. International Test Conference (ITC) (8 paper(s))
3. (6 paper(s))
4. Design, Automation, and Test in Europe (5 paper(s))
5. Asian Test Symposium (4 paper(s))
6. Defect and Fault Tolerance in VLSI Systems (2 paper(s))
7. European Design and Test Conference (EDAC) (2 paper(s))
8. (1 paper(s))
9. Field-Programmable Logic and Applications (FPL) (1 paper(s))
10. ACM Great Lakes Symposium on VLSI (1 paper(s))
11. International On-Line Testing Symposium / Workshop (1 paper(s))
12. IEEE International Symposium on Circuits and Systems (ISCAS) (1 paper(s))
13. Microelectronics Systems Education (1 paper(s))