Conferences in DBLP

IEEE International Software Metrics Symposium (metrics)
2002 (conf/metrics/2002)

1. Erik Stensrud, Tron Foss, Barbara Kitchenham, Ingunn Myrtveit
   An Empirical Validation of the Relationship Between the Magnitude of Relative Error and Project Size. [Citation Graph (0, 0)][DBLP]
   IEEE METRICS, 2002, pp:3-12 [Conf]
   
2. Petr Musílek, Witold Pedrycz, Nan Sun, Giancarlo Succi
   On the Sensitivity of COCOMO II Software Cost Estimation Model. [Citation Graph (0, 0)][DBLP]
   IEEE METRICS, 2002, pp:13-20 [Conf]
   
3. Ali Idri, Alain Abran, Taghi M. Khoshgoftaar
   Estimating Software Project Effort by Analogy Based on Linguistic Values. [Citation Graph (0, 0)][DBLP]
   IEEE METRICS, 2002, pp:21-0 [Conf]
   
4. Erik Arisholm
   Dynamic Coupling Measures for Object-Oriented Software. [Citation Graph (0, 0)][DBLP]
   IEEE METRICS, 2002, pp:33-42 [Conf]
   
5. William M. Evanco
   Architectural Tradeoffs at the Object. [Citation Graph (0, 0)][DBLP]
   IEEE METRICS, 2002, pp:43-53 [Conf]
   
6. Benoit Baudry, Yves Le Traon, Gerson Sunyé
   Testability Analysis of a UML Class Diagram. [Citation Graph (0, 0)][DBLP]
   IEEE METRICS, 2002, pp:54-0 [Conf]
   
7. Yasushi Ueda, Toshihiro Kamiya, Shinji Kusumoto, Katsuro Inoue
   Gemini: Maintenance Support Environment Based on Code Clone Analysis. [Citation Graph (0, 0)][DBLP]
   IEEE METRICS, 2002, pp:67-76 [Conf]
   
8. Mikael Lindvall, Roseanne Tesoriero Tvedt, Patricia Costa
   Avoiding Architectural Degeneration: An Evaluation Process for Software Architecture. [Citation Graph (0, 0)][DBLP]
   IEEE METRICS, 2002, pp:77-86 [Conf]
   
9. Akito Monden, Daikai Nakae, Toshihiro Kamiya, Shin-ichi Sato, Ken-ichi Matsumoto
   Software Quality Analysis by Code Clones in Industrial Legacy Software. [Citation Graph (0, 0)][DBLP]
   IEEE METRICS, 2002, pp:87-0 [Conf]
   
10. Oliver Laitenberger, Thomas Beil, Thilo Schwinn
    An Industrial Case Study to examine a non-traditional Inspection Implementation for Requirements Specifications. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2002, pp:97-106 [Conf]
    
11. Stefan Biffl, Michael Halling
    Investigating the Influence of Inspector Capability Factors with Four Inspection Techniques on Inspection Performance. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2002, pp:107-117 [Conf]
    
12. Claes Wohlin, Aybüke Aurum, Håkan Petersson, Forrest Shull, Marcus Ciolkowski
    Software Inspection Benchmarking - A Qualitative and Quantitative Comparative Opportunity. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2002, pp:118-0 [Conf]
    
13. Emilia Mendes, Ian Watson, Chris Triggs, Nile Mosley, Steve Counsell
    A Comparison of Development Effort Estimation Techniques for Web Hypermedia Applications. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2002, pp:131-140 [Conf]
    
14. Daniel Rodríguez, Rachel Harrison, Manoranjan Satpathy
    A Generic Model and Tool Support for Assessing and Improving Web Processes. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2002, pp:141-151 [Conf]
    
15. Elaine J. Weyuker, Alberto Avritzer
    A Metric to Predict Software Scalability. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2002, pp:152-0 [Conf]
    
16. Taghi M. Khoshgoftaar, Erik Geleyn, Kehan Gao
    An Empirical Study of the Impact of Count Models Predictions on Module-Order Models. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2002, pp:161-172 [Conf]
    
17. Ned Chapin
    Entropy mdash; Metric For Systems With COTS Software. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2002, pp:173-181 [Conf]
    
18. Edward B. Allen
    Measuring Graph Abstractions of Software: An Information-Theory Approach. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2002, pp:182-0 [Conf]
    
19. Maurizio Pighin, Vili Podgorelec, Peter Kokol
    Program Risk Definition via Linear Programming Techniques. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2002, pp:197-196 [Conf]
    
20. Taghi M. Khoshgoftaar, Naeem Seliya
    Tree-Based Software Quality Estimation Models For Fault Prediction. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2002, pp:203-0 [Conf]
    
21. Magnus C. Ohlsson, Per Runeson
    Experience from Replicating Empirical Studies on Prediction Models. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2002, pp:217-226 [Conf]
    
22. Michel Dao, Marianne Huchard, Thérèse Libourel, Cyril Roume, Hervé Leblanc
    A New Approach to Factorization - Introducing Metrics. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2002, pp:227-236 [Conf]
    
23. Isabella Wieczorek, Melanie Ruhe
    How Valuable is company-specific Data Compared to multi-company Data for Software Cost Estimation? [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2002, pp:237-0 [Conf]
    
24. Forrest Shull, Victor R. Basili, Barry W. Boehm, A. Winsor Brown, Patricia Costa, Mikael Lindvall, Daniel Port, Ioana Rus, Roseanne Tesoriero, Marvin V. Zelkowitz
    What We Have Learned About Fighting Defects. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2002, pp:249-0 [Conf]