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Conferences in DBLP

IEEE International Software Metrics Symposium (metrics)
2003 (conf/metrics/2003)

  1. Shari Lawrence Pfleeger
    Keynote: May The Force Be With You: The Role of Evidential Force in Empirical Software Engineering. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:- [Conf]
  2. H. Dieter Rombach
    Keynote: Evidence Based Software Engineering: A Pre-Requisite for Useful Research and Technology Transfer. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:- [Conf]
  3. Pam Morris
    Keynote: Metrics Based Project Governance. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:- [Conf]
  4. Alain Abran, Asma Sellami, Witold Suryn
    Metrology, Measurement and Metrics in Software Engineering. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:2-0 [Conf]
  5. Emilia Mendes, Nile Mosley, Steve Counsell
    Early Web Size Measures and Effort Prediction for Web Costimation. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:18-29 [Conf]
  6. Melanie Ruhe, D. Ross Jeffery, Isabella Wieczorek
    Using Web Objects for Estimating Software Development Effort for Web Applications. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:30-0 [Conf]
  7. James M. Bieman, Greg Straw, Huxia Wang, P. Willard Munger, Roger T. Alexander
    Design Patterns and Change Proneness: An Examination of Five Evolving Systems. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:40-49 [Conf]
  8. Benoit Baudry, Yves Le Traon, Gerson Sunyé, Jean-Marc Jézéquel
    Measuring and Improving Design Patterns Testability. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:50-0 [Conf]
  9. Luciano Baresi, Sandro Morasca, Paolo Paolini
    Estimating the Design Effort of Web Applications. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:62-72 [Conf]
  10. Stephen G. MacDonell, Martin J. Shepperd
    Using Prior-Phase Effort Records for Re-estimation During Software Projects. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:73-0 [Conf]
  11. Tim Menzies, Justin S. Di Stefano, Mike Chapman
    Learning Early Lifecycle IV&V Quality Indicators. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:88-97 [Conf]
  12. Tim Menzies, Justin S. Di Stefano, Kareem Ammar, Kenneth McGill, Pat Callis, Robert (Mike) Chapman, John Davis
    When Can We Test Less? [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:98-0 [Conf]
  13. Warwick Irwin, Neville I. Churcher
    Object Oriented Metrics: Precision Tools and Configurable Visualisations. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:112-123 [Conf]
  14. Pablo Rossi, George Fernandez
    Definition and Validation of Design Metrics for Distributed Applications. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:124-0 [Conf]
  15. Eduard Metzker
    An Experimental Process Metrics Support Environment and a Cross-Organizational Study on its Acceptance by Practitioners. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:135-143 [Conf]
  16. Martin Auer, Bernhard Graser, Stefan Biffl
    A Survey on the Fitness of Commercial Software Metric Tools for Service in Heterogeneous Environments: Common Pitfalls. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:144-0 [Conf]
  17. Michelle Cartwright, Martin J. Shepperd, Qinbao Song
    Dealing with Missing Software Project Data. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:154-165 [Conf]
  18. Frank Padberg, Matthias M. Müller
    Analyzing the Cost and Benefit of Pair Programming. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:166-0 [Conf]
  19. Birgit Geppert, David M. Weiss
    Goal-Oriented Assessment of Product-Line Domains. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:180-188 [Conf]
  20. Sunita Chulani, Bonnier Ray, Padmanabhan Santhanam, R. Leszkowicz
    Metrics for Managing Customer View of Software Quality. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:189-0 [Conf]
  21. Silvia Mara Abrahão, Nelly Condori-Fernández, Luis Olsina, Oscar Pastor
    Defining and Validating Metrics for Navigational Models. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:200-210 [Conf]
  22. Hironori Washizaki, Hirokazu Yamamoto, Yoshiaki Fukazawa
    A Metrics Suite for Measuring Reusability of Software Components. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:211-0 [Conf]
  23. Tomas Berling, Thomas Thelin
    An Industrial Case Study of the Verification and Validation Activities. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:226-238 [Conf]
  24. Jeffrey Carver, Maria Letizia Jaccheri, Sandro Morasca, Forrest Shull
    Issues in Using Students in Empirical Studies in Software Engineering Education. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:239-0 [Conf]
  25. David Grosser, Houari A. Sahraoui, Petko Valtchev
    An Analogy-Based Approach for Predicting Design Stability of Java Classes. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:252-262 [Conf]
  26. Marcela Genero, Mario Piattini, M. Esperanza Manso, Giovanni Cantone
    Building UML Class Diagram Maintainability Prediction Models Based on Early Metrics. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:263-0 [Conf]
  27. Michael Halling, Stefan Biffl, Paul Grünbacher
    An Experiment Family to Investigate the Defect Detection Effect of Tool-Support for Requirements Inspection. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:278-285 [Conf]
  28. Claes Wohlin, Aybüke Aurum
    An Evaluation of Checklist-Based Reading for Entity-Relationship Diagrams. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:286-0 [Conf]
  29. André van der Hoek, Ebru Dincel, Nenad Medvidovic
    Using Service Utilization Metrics to Assess the Structure of Product Line Architectures. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:298-308 [Conf]
  30. Robert Leitch, Eleni Stroulia
    Assessing the Maintainability Benefits of Design Restructuring Using Dependency Analysis. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:309-0 [Conf]
  31. Rachel M. Fewster, Emilia Mendes
    Portfolio Management Method for Deadline Planning. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:325-350 [Conf]
  32. Masahide Nakamura, Akito Monden, Tomoaki Itoh, Ken-ichi Matsumoto, Yuichiro Kanzaki, Hirotsugu Satoh
    Queue-Based Cost Evaluation of Mental Simulation Process in Program Comprehension. [Citation Graph (0, 0)][DBLP]
    IEEE METRICS, 2003, pp:351-0 [Conf]
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