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Journals in DBLP
D&T Elevated to Bimonthly. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2000, v:17, n:4, pp:3-0 [Journal]
- Magdy S. Abadir, Sumit DasGupta
Guest Editors' Introduction: Microprocessor Test and Verification. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2000, v:17, n:4, pp:4-5 [Journal]
- Wei-Cheng Lai, Angela Krstic, Kwang-Ting (Tim) Cheng
Functionally Testable Path Delay Faults on a Microprocessor. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2000, v:17, n:4, pp:6-14 [Journal]
- Nektarios Kranitis, Dimitris Gizopoulos, Antonis M. Paschalis, Mihalis Psarakis, Yervant Zorian
Power-/Energy Efficient BIST Schemes for Processor Data Paths. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2000, v:17, n:4, pp:15-28 [Journal]
- Alfred L. Crouch, Michael Mateja, Teresa L. McLaurin, John C. Potter, Dat Tran
Test Development for a Third-Version ColdFire Microprocessor. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2000, v:17, n:4, pp:29-37 [Journal]
- Noppanunt Utamaphethai, R. D. (Shawn) Blanton, John Paul Shen
Effectiveness of Microarchitecture Test Program Generation. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2000, v:17, n:4, pp:38-49 [Journal]
- David Van Campenhout, Trevor N. Mudge, John P. Hayes
Collection and Analysis of Microprocessor Design Errors. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2000, v:17, n:4, pp:51-60 [Journal]
- Narayanan Krishnamurthy, Andrew K. Martin, Magdy S. Abadir, Jacob A. Abraham
Validating PowerPC Microprocessor Custom Memories. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2000, v:17, n:4, pp:61-76 [Journal]
- Hemant G. Rotithor
Postsilicon Validation Methodology for Microprocessors. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2000, v:17, n:4, pp:77-88 [Journal]
- Subhasish Mitra, LaNae J. Avra, Edward J. McCluskey
Efficient Multiplexer Synthesis Techniques. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2000, v:17, n:4, pp:90-97 [Journal]
A D&T Roundtable: Power Delivery and Distribution. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2000, v:17, n:4, pp:98-102 [Journal]
Standards. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2000, v:17, n:4, pp:102-103 [Journal]
Panel Summaries. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2000, v:17, n:4, pp:104-105 [Journal]
TTTC Newsletter. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2000, v:17, n:4, pp:106-107 [Journal]
DATC Newsletter. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2000, v:17, n:4, pp:108-0 [Journal]
IEEE Design & Test of Computers 2000 Annual Index, Volume 17. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2000, v:17, n:4, pp:109-117 [Journal]
- Scott Davidson
Testing in 2100. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2000, v:17, n:4, pp:119-120 [Journal]
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