Journals in DBLP

IEEE Design & Test of Computers
1997, volume: 14, number: 3

1. 
   About this super issue. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1997, v:14, n:3, pp:1-0 [Journal]
   
2. 
   News. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1997, v:14, n:3, pp:6- [Journal]
   
3. Luciano Lavagno, Nanette Collins
   DAC 97 Panel: Next-Generation HDLs. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1997, v:14, n:3, pp:7-8 [Journal]
   
4. 
   Conference Reports. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1997, v:14, n:3, pp:8-10 [Journal]
   
5. Gadi Singer
   The Future of Test and DFT. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1997, v:14, n:3, pp:11-14 [Journal]
   
6. Tony Ambler, Magdy S. Abadir
   Design and Test Economics-An Extra Dimension. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1997, v:14, n:3, pp:15-16 [Journal]
   
7. José M. Miranda
   A BIST and Boundary-Scan Economics Framework. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1997, v:14, n:3, pp:17-23 [Journal]
   
8. James Debardelaben, Vijay K. Madisetti, Anthony J. Gadient
   Incorporating Cost Modeling in Embedded-System Design. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1997, v:14, n:3, pp:24-35 [Journal]
   
9. Craig T. Pynn
   Analyzing Manufacturing Test Costs. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1997, v:14, n:3, pp:36-40 [Journal]
   
10. Jon Turino
    Test Economics in the 21st Century. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:3, pp:41-44 [Journal]
    
11. Magdy S. Abadir, Rohit Kapur
    Cost-Driven Ranking of Memory Elements for Partial Intrusion. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:3, pp:45-50 [Journal]
    
12. Des Farren, Anthony P. Ambler
    The Economics of System-Level Testing. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:3, pp:51-58 [Journal]
    
13. Jerry M. Soden, Richard E. Anderson, Christopher L. Henderson
    IC Failure Analysis: Magic, Mystery, and Science. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:3, pp:59-69 [Journal]
    
14. Donald Staab, Eugene R. Hnatek
    Diagnosing IC Failures in a Fast Environment. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:3, pp:70-75 [Journal]
    
15. David P. Vallett
    IC Failure Analysis: The Importance of Test and Diagnostics. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:3, pp:76-82 [Journal]
    
16. Kenneth M. Butler, Karl Johnson, Jeff Platt, Anjali Kinra, Jayashree Saxena
    Automated Diagnosis in Testing and Failure Analysis. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:3, pp:83-89 [Journal]
    
17. Keith Baker, Jos van Beers
    Shmoo Plotting: The Black Art of IC Testing. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:3, pp:90-97 [Journal]
    
18. Robert C. Aitken
    Modeling the Unmodelable: Algorithmic Fault Diagnosis. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:3, pp:98-103 [Journal]
    
19. Mario Zagar, Danko Basch
    Microprocessor Architecture Design with ATLAS. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:3, pp:104-112 [Journal]
    
20. 
    A D&T Roundtable: Built-In Self-Test for Designers. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:3, pp:113-121 [Journal]
    
21. 
    Design Automation Technical Committee Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:3, pp:123-125 [Journal]
    
22. 
    Test Technology Tc Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:3, pp:126-127 [Journal]
    
23. Jerry M. Soden, Christopher L. Henderson
    Still in the Stone Age? [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1997, v:14, n:3, pp:128-0 [Journal]