Manoj Sachdev Current-Based Testing for Deep-Submicron VLSIs. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2001, v:18, n:2, pp:76-84 [Journal]
Panel Summaries. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2001, v:18, n:2, pp:86-91 [Journal]
Conference Reports. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2001, v:18, n:2, pp:92-94 [Journal]
Standards. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2001, v:18, n:2, pp:95-0 [Journal]
A D&T Roundtable: Industrial and University Test Research Collaboration. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2001, v:18, n:2, pp:98-105 [Journal]
TTTC Newsletter. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2001, v:18, n:2, pp:109-110 [Journal]
DATC Newsletter. [Citation Graph (0, 0)][DBLP] IEEE Design & Test of Computers, 2001, v:18, n:2, pp:111-0 [Journal]