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Journals in DBLP

IEEE Design & Test of Computers
2006, volume: 23, number: 1

  1. Kwang-Ting Cheng
    New beginnings, continued success. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:1, pp:5-6 [Journal]
  2. Bernhard Peischl, Franz Wotawa
    Automated Source-Level Error Localization in Hardware Designs. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:1, pp:8-19 [Journal]
  3. Hamilton Klimach, Carlos Galup-Montoro, Márcio C. Schneider, Alfredo Arnaud
    MOSFET Mismatch Modeling: A New Approach. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:1, pp:20-29 [Journal]
  4. Kevin Lucas, Chi-Min Yuan, Robert Boone, Karl Wimmer, Kirk Strozewski, Olivier Toublan
    Logic Design for Printability Using OPC Methods. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:1, pp:30-37 [Journal]
  5. Julio Pérez Acle, Matteo Sonza Reorda, Massimo Violante
    Early, Accurate Dependability Analysis of CAN-Based Networked Systems. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:1, pp:38-45 [Journal]
  6. David C. Keezer, Dany Minier, Patrice Ducharme
    Source-Synchronous Testing of Multilane PCI Express and HyperTransport Buses. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:1, pp:46-57 [Journal]
  7. Antonio Petraglia, Jorge M. Cañive, Mariane R. Petraglia
    Efficient Parametric Fault Detection in Switched-Capacitor Filters. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:1, pp:58-66 [Journal]
  8. Scott Davidson
    Searching for clues: Diagnosing IC failures. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:1, pp:67-68 [Journal]
  9. Christopher Songer
    Embedded systems and the kitchen sink. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:1, pp:69-70 [Journal]
  10. Ken Butler
    Conference Reports: 2005 International Test Conference. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:1, pp:71- [Journal]

  11. TTTC Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:1, pp:76-77 [Journal]

  12. DATC Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:1, pp:78- [Journal]
  13. Scott Davidson
    All about getting it. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2006, v:23, n:1, pp:80- [Journal]
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