Journals in DBLP

IEEE Design & Test of Computers
1990, volume: 7, number: 1

1. 
   D&T News. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1990, v:7, n:1, pp:2- [Journal]
   
2. 
   Editorial Calendar. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1990, v:7, n:1, pp:4-0 [Journal]
   
3. Ben Bennetts
   Test Technology in Europe. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1990, v:7, n:1, pp:6-8 [Journal]
   
4. R. P. van Riessen, Hans G. Kerkhoff, A. Kloppenburg
   Designing and Implementing an Architecture with Boundary Scan. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1990, v:7, n:1, pp:9-19 [Journal]
   
5. Hugu K. Seitz, Armin Blacha, Rolf Clauberg, H. Beha, J. Feder
   Contactless High-Speed Waveform Measurements on Gallium. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1990, v:7, n:1, pp:20-25 [Journal]
   
6. Phil Nigh, Wojciech Maly
   Test Generation for Current Testing (CMOS ICs). [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1990, v:7, n:1, pp:26-38 [Journal]
   
7. Bas Verhelst
   Using a Test-Specification Format in Automatic Test-Program Generation. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1990, v:7, n:1, pp:39-45 [Journal]
   
8. 
   The Challenges of Self-Test. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1990, v:7, n:1, pp:46-54 [Journal]
   
9. 
   A D&T Roundtable: Behavioral Description Languages, Part 1: Are Designers Benefitting? [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1990, v:7, n:1, pp:56-62 [Journal]
   
10. 
    The 1989 Annual Index. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1990, v:7, n:1, pp:63-67 [Journal]
    
11. 
    DATC Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1990, v:7, n:1, pp:70-71 [Journal]