Journals in DBLP
Conference Reports. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1993, v:10, n:1, pp:2-3 [Journal ] Book Review. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1993, v:10, n:1, pp:4-5 [Journal ] Pinaki Mazumder , John P. Hayes Guest Editor's Introduction: Testing and Improving the Testability of Multimegabit Memories. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1993, v:10, n:1, pp:6-7 [Journal ] A. J. van de Goor Using March Tests to Test SRAMs. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1993, v:10, n:1, pp:8-14 [Journal ] Michihiro Inoue , Toshio Yamada , Atsushi Fujiwara A New Testing Acceleration Chip for Low-Cost Memory Tests. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1993, v:10, n:1, pp:15-19 [Journal ] Prathima Agrawal , Vishwani D. Agrawal , Sharad C. Seth Generating Tests for Delay Faults in Nonscan Circuits. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1993, v:10, n:1, pp:20-28 [Journal ] Biswadip Mitra , Preeti Ranjan Panda , Parimal Pal Chaudhuri Estimating the Complexity of Synthesized Designs from FSM Specifications. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1993, v:10, n:1, pp:30-35 [Journal ] B. Naveen , K. S. Raghunathan An Automatic Netlist-to-Schematic Generator. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1993, v:10, n:1, pp:36-41 [Journal ] Peter C. Maxwell , Robert C. Aitken Test Sets and Reject Rates: All Fault Coverages are Not Created Equal. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1993, v:10, n:1, pp:42-51 [Journal ] William R. Simpson , John W. Sheppard Fault Isolation in an Integrated Diagnostic Environment. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1993, v:10, n:1, pp:52-66 [Journal ] Karl R. Umstadter , Don L. Millard , Robert C. Block Applications of a Laser-Induced Plasma Pathway to Testing of Electronic Modules. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1993, v:10, n:1, pp:67-72 [Journal ] Vishwani D. Agrawal , Charles R. Kime , Kewal K. Saluja A Tutorial on Built-in Self-Test. I. Principles. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1993, v:10, n:1, pp:73-82 [Journal ] A D&T Roundtable. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1993, v:10, n:1, pp:83-91 [Journal ] TTTC Newsletter. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1993, v:10, n:1, pp:92-93 [Journal ] DATC Newsletter. [Citation Graph (0, 0)][DBLP ] IEEE Design & Test of Computers, 1993, v:10, n:1, pp:94-95 [Journal ]