Journals in DBLP

IEEE Design & Test of Computers
1993, volume: 10, number: 1

1. 
   Conference Reports. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1993, v:10, n:1, pp:2-3 [Journal]
   
2. 
   Book Review. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1993, v:10, n:1, pp:4-5 [Journal]
   
3. Pinaki Mazumder, John P. Hayes
   Guest Editor's Introduction: Testing and Improving the Testability of Multimegabit Memories. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1993, v:10, n:1, pp:6-7 [Journal]
   
4. A. J. van de Goor
   Using March Tests to Test SRAMs. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1993, v:10, n:1, pp:8-14 [Journal]
   
5. Michihiro Inoue, Toshio Yamada, Atsushi Fujiwara
   A New Testing Acceleration Chip for Low-Cost Memory Tests. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1993, v:10, n:1, pp:15-19 [Journal]
   
6. Prathima Agrawal, Vishwani D. Agrawal, Sharad C. Seth
   Generating Tests for Delay Faults in Nonscan Circuits. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1993, v:10, n:1, pp:20-28 [Journal]
   
7. Biswadip Mitra, Preeti Ranjan Panda, Parimal Pal Chaudhuri
   Estimating the Complexity of Synthesized Designs from FSM Specifications. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1993, v:10, n:1, pp:30-35 [Journal]
   
8. B. Naveen, K. S. Raghunathan
   An Automatic Netlist-to-Schematic Generator. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1993, v:10, n:1, pp:36-41 [Journal]
   
9. Peter C. Maxwell, Robert C. Aitken
   Test Sets and Reject Rates: All Fault Coverages are Not Created Equal. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1993, v:10, n:1, pp:42-51 [Journal]
   
10. William R. Simpson, John W. Sheppard
    Fault Isolation in an Integrated Diagnostic Environment. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1993, v:10, n:1, pp:52-66 [Journal]
    
11. Karl R. Umstadter, Don L. Millard, Robert C. Block
    Applications of a Laser-Induced Plasma Pathway to Testing of Electronic Modules. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1993, v:10, n:1, pp:67-72 [Journal]
    
12. Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja
    A Tutorial on Built-in Self-Test. I. Principles. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1993, v:10, n:1, pp:73-82 [Journal]
    
13. 
    A D&T Roundtable. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1993, v:10, n:1, pp:83-91 [Journal]
    
14. 
    TTTC Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1993, v:10, n:1, pp:92-93 [Journal]
    
15. 
    DATC Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1993, v:10, n:1, pp:94-95 [Journal]