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Journals in DBLP

IEEE Design & Test of Computers
2002, volume: 19, number: 3


  1. Enabling IP. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2002, v:19, n:3, pp:1-0 [Journal]

  2. Guest Editor's Introduction: What is Infrastructure IP? [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2002, v:19, n:3, pp:5-7 [Journal]
  3. Teresa L. McLaurin, Souvik Ghosh
    ETM10 Incorporates Hardware Segment of IEEE P1500. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2002, v:19, n:3, pp:8-13 [Journal]
  4. Jim Bordelon, Ben Tranchina, Vipin Madangarli, Mark Craig
    A Strategy for Mixed-Signal Yield Improvement. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2002, v:19, n:3, pp:14-23 [Journal]
  5. Sassan Tabatabaei, André Ivanov
    Embedded Timing Analysis: A SoC Infrastructure. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2002, v:19, n:3, pp:24-36 [Journal]
  6. Bart Vermeulen, Sandeep Kumar Goel
    Design for Debug: Catching Design Errors in Digital Chips. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2002, v:19, n:3, pp:37-45 [Journal]
  7. Stephen Pateras
    IP for Embedded Diagnosis. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2002, v:19, n:3, pp:46-55 [Journal]
  8. Eric Dupont, Michael Nicolaidis, Peter Rohr
    Embedded Robustness IPs for Transient-Error-Free ICs. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2002, v:19, n:3, pp:56-70 [Journal]
  9. Andrew E. Caldwell, Igor L. Markov
    Toward CAD-IP Reuse: A Web Bookshelf of Fundamental Algorithms. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2002, v:19, n:3, pp:72-81 [Journal]
  10. Patrick Girard
    Survey of Low-Power Testing of VLSI Circuits. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2002, v:19, n:3, pp:82-92 [Journal]
  11. Alfredo Benso, Silvia Chiusano, Paolo Prinetto
    DFT and BIST of a Multichip Module for High-Energy Physics Experiments. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2002, v:19, n:3, pp:94-105 [Journal]

  12. Design and Test Education in Latin America. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2002, v:19, n:3, pp:106-113 [Journal]
  13. Peter J. Ashenden
    What Makes a Good Standard? [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2002, v:19, n:3, pp:114-115 [Journal]
  14. Adam Osseiran
    Conference Reports. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2002, v:19, n:3, pp:116-0 [Journal]

  15. DATC Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2002, v:19, n:3, pp:117-0 [Journal]

  16. TTTC Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2002, v:19, n:3, pp:118-119 [Journal]
  17. Andrew B. Kahng
    Variability. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2002, v:19, n:3, pp:120- [Journal]
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