Journals in DBLP

IEEE Design & Test of Computers
1993, volume: 10, number: 2

1. 
   News. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1993, v:10, n:2, pp:2-3 [Journal]
   
2. 
   Conference Reports. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1993, v:10, n:2, pp:4-5 [Journal]
   
3. Masaki Tsukude, Kazutami Arimoto, Hideto Hidaka, Yasuhiro Konishi, Masanori Hayashikoshi, Katsuhiro Suma, Kazuyasu Fujishima
   Highly Reliable Testing of ULSI Memories with On-Chip Voltage-Down Converters. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1993, v:10, n:2, pp:6-12 [Journal]
   
4. Samir Naik, Frank Agricola, Wojciech Maly
   Failure Analysis of High-Density CMOS SRAMs: Using Realistic Defect Modeling and I/Sub DDQ/ Testing. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1993, v:10, n:2, pp:13-23 [Journal]
   
5. Robert P. Treuer, Vinod K. Agarwal
   Built-In Self-Diagnosis for Repairable Embedded RAMs. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1993, v:10, n:2, pp:24-33 [Journal]
   
6. Jos van Sas, Francky Catthoor, Hugo De Man
   Test Algorithms for Double-Buffered Random Access and Pointer-Addressed Memories. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1993, v:10, n:2, pp:34-44 [Journal]
   
7. 
   1994 Editorial Calendar. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1993, v:10, n:2, pp:55-0 [Journal]
   
8. Steve Vinoski
   RISE++: A Symbolic Environment for Scan-Based Testing. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1993, v:10, n:2, pp:56-68 [Journal]
   
9. Vishwani D. Agrawal, Charles R. Kime, Kewal K. Saluja
   A Tutorial on Built-In Self-Test, Part 2: Applications. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 1993, v:10, n:2, pp:69-77 [Journal]
   
10. John W. Sheppard, William R. Simpson
    Performing Effective Fault Isolation in Integrated Diagnostics. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1993, v:10, n:2, pp:78-90 [Journal]
    
11. 
    New Products. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1993, v:10, n:2, pp:91-0 [Journal]
    
12. 
    TTTC Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1993, v:10, n:2, pp:92-93 [Journal]
    
13. 
    DATC Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 1993, v:10, n:2, pp:94-95 [Journal]