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Journals in DBLP

IEEE Design & Test of Computers
2004, volume: 21, number: 6

  1. Rajesh K. Gupta
    Verification synergies. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:6, pp:457- [Journal]
  2. Carl Pixley, Sharad Malik
    Guest Editors' Introduction: Exploring Synergies for Design Verification. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:6, pp:461-463 [Journal]
  3. Martin Zambaldi, Wolfgang Ecker, Renate Henftling, Matthias Bauer
    A Layered Adaptive Verification Platform for Simulation, Test, and Emulation. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:6, pp:464-471 [Journal]
  4. Serdar Tasiran, Yuan Yu, Brannon Batson
    Linking Simulation with Formal Verification at a Higher Level. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:6, pp:472-482 [Journal]
  5. Young-Il Kim, Chong-Min Kyung
    TPartition: Testbench Partitioning for Hardware-Accelerated Functional Verification. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:6, pp:484-493 [Journal]
  6. Jayanta Bhadra, Narayanan Krishnamurthy, Magdy S. Abadir
    Enhanced Equivalence Checking: Toward a Solidarity of Functional Verification and Manufacturing Test Generation. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:6, pp:494-502 [Journal]
  7. Shuo Sheng, Michael S. Hsiao
    Success-Driven Learning in ATPG for Preimage Computation. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:6, pp:504-512 [Journal]
  8. Ioannis Papaefstathiou
    Titan II: An IPcomp Processor for 10-Gbps Networks. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:6, pp:514-523 [Journal]
  9. Frederic Worm, Paolo Ienne, Patrick Thiran, Giovanni De Micheli
    On-Chip Self-Calibrating Communication Techniques Robust to Electrical Parameter Variations. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:6, pp:524-535 [Journal]
  10. Marcel A. Kossel, Martin L. Schmatz
    Jitter Measurements of High-Speed Serial Links. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:6, pp:536-543 [Journal]
  11. Glenn H. Chapman, Sunjaya Djaja, Desmond Y. H. Cheung, Yves Audet, Israel Koren, Zahava Koren
    A Self-Correcting Active Pixel Sensor Using Hardware and Software Correction. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:6, pp:544-551 [Journal]
  12. Fernanda Lima Kastensmidt, Gustavo Neuberger, Renato Fernandes Hentschke, Luigi Carro, Ricardo Reis
    Designing Fault-Tolerant Techniques for SRAM-Based FPGAs. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:6, pp:552-562 [Journal]
  13. Naran Sirisantana, Bipul Chandra Paul, Kaushik Roy
    Enhancing Yield at the End of the Technology Roadmap. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:6, pp:563-571 [Journal]
  14. Ikhwan Lee, Yongseok Choi, Youngjin Cho, Yongsoo Joo, Hyeonmin Lim, Hyung Gyu Lee, Hojun Shim, Naehyuck Chang
    Web-Based Energy Exploration Tool for Embedded Systems. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:6, pp:572-586 [Journal]

  15. Book Reviews. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:6, pp:590-591 [Journal]
  16. Victor Berman
    System-level design language standard needed. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:6, pp:592-593 [Journal]
  17. Vladimir Hahanov, Raimund Ubar, Subhasish Mitra
    Conference Reports. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:6, pp:594-595 [Journal]

  18. DATC Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:6, pp:596- [Journal]
  19. Scott Davidson
    Design illiteracy. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:6, pp:608- [Journal]
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