Journals in DBLP

IEEE Design & Test of Computers
2004, volume: 21, number: 4

1. 
   From the EIC: Manufacturing test woes. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2004, v:21, n:4, pp:269-270 [Journal]
   
2. Sumit DasGupta
   Looking back, looking around. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2004, v:21, n:4, pp:271-273 [Journal]
   
3. André Ivanov, Fabrizio Lombardi, Cecilia Metra
   Guest Editors' Introduction: Advances in VLSI Testing at MultiGbps Rates. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2004, v:21, n:4, pp:274-276 [Journal]
   
4. T. M. Mak, Mike Tripp, Anne Meixner
   Testing Gbps Interfaces without a Gigahertz Tester. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2004, v:21, n:4, pp:278-286 [Journal]
   
5. David C. Keezer, Dany Minier, Marie-Christine Caron
   Multiplexing ATE Channels for Production Testing at 2.5 Gbps. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2004, v:21, n:4, pp:288-301 [Journal]
   
6. Nelson Ou, Touraj Farahmand, Andy Kuo, Sassan Tabatabaei, André Ivanov
   Jitter Models for the Design and Test of Gbps-Speed Serial Interconnects. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2004, v:21, n:4, pp:302-313 [Journal]
   
7. Stephen K. Sunter, Aubin Roy
   On-Chip Digital Jitter Measurement, from Megahertz to Gigahertz. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2004, v:21, n:4, pp:314-321 [Journal]
   
8. Ming-Jun Hsiao, Jing-Reng Huang, Tsin-Yuan Chang
   A Built-In Parametric Timing Measurement Unit. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2004, v:21, n:4, pp:322-330 [Journal]
   
9. Debesh K. Das, Hideo Fujiwara, Yungang Li, Yinghua Min, Shiyi Xu, Yervant Zorian
   Design & Test Education in Asia. [Citation Graph (0, 0)][DBLP]
   IEEE Design & Test of Computers, 2004, v:21, n:4, pp:331-338 [Journal]
   
10. 
    Conference Reports. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:4, pp:339-341 [Journal]
    
11. 
    Panel Summaries. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:4, pp:342-0 [Journal]
    
12. John Willis, Joe Damore
    Design automation Technical Committee Newsletter. [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:4, pp:343-0 [Journal]
    
13. Rob Aitken
    Test at Gbps: Megaproblem or micromanagement? [Citation Graph (0, 0)][DBLP]
    IEEE Design & Test of Computers, 2004, v:21, n:4, pp:344-0 [Journal]